Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain, Max Engelhardt
(Statistics : textbooks and monographs ; v. 115)
Publisher | New York : M. Dekker |
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Year | c1991 |
Edition | 2nd ed |
Authors | *Bain, Lee J., 1939- Engelhardt, Max |
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Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Restriction | Reserve |
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Library Main Building Basement (Foreign Books) |
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LAe:1:115 | 129108181V |
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Material Type | Books |
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Size | vii, 496 p. ; 24 cm |
Notes | Includes bibliographical references (p. 479-491) and index |
Subjects | LCSH:Reliability (Engineering) -- Statistical methods
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LCSH:Accelerated life testing LCSH:Distribution (Probability theory) LCSH:Mathematical statistics |
Classification | LCC:TS173 DC20:620/.00452 |
Language | English |
ID | 0000244930 |
ISBN | 0824785061 |
NCID | BA1235996X |
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