Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain, Max Engelhardt
(Statistics : textbooks and monographs ; v. 115)
| Publisher | New York : M. Dekker |
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| Year | c1991 |
| Edition | 2nd ed |
| Authors | *Bain, Lee J., 1939- Engelhardt, Max |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Restriction | Reserve |
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| Library Main Building Basement (Foreign Books) |
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LAe:1:115 | 129108181V |
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| Material Type | Books |
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| Size | vii, 496 p. ; 24 cm |
| Notes | Includes bibliographical references (p. 479-491) and index |
| Subjects | LCSH:Reliability (Engineering) -- Statistical methods
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LCSH:Accelerated life testing LCSH:Distribution (Probability theory) LCSH:Mathematical statistics |
| Classification | LCC:TS173 DC20:620/.00452 |
| Language | English |
| ID | 0000244930 |
| ISBN | 0824785061 |
| NCID |
BA1235996X 
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