Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar
(Wiley series in probability and mathematical statistics ; Applied probability and statistics)
Publisher | New York : Wiley |
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Year | c1998 |
Authors | *Meeker, William Q. Escobar, Luis, 1944- |
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Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Restriction | Reserve |
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Library Main Building 3rd fl. (Foreign Books) |
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3366:115 | 129803117W |
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Material Type | Books |
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Size | xxii, 680 p. : ill. ; 25 cm |
Notes | "A Wiley-Interscience publication." Bibliography : p. 645-663 Includes index |
Subjects | LCSH:Reliability (Engineering) -- Statistical methods All Subject Search |
Classification | NDC9:509.6 LCC:TS173 DC21:620/.00452 |
Language | English |
ID | 0000378116 |
ISBN | 0471143286 |
NCID | BA37266814 |
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