Applied survival analysis : regression modeling of time to event data / David W. Hosmer, Jr., Stanley Lemeshow
(Wiley series in probability and mathematical statistics ; . Texts and references section)
| Publisher | New York : Wiley |
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| Year | c1999 |
| Authors | *Hosmer, David W. Lemeshow, Stanley |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Restriction | Reserve |
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| Library Main Building 3rd fl. (Foreign Books) |
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4900:162 | 129900743Z |
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| Material Type | Books |
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| Size | xiii, 386 p. : ill. ; 25 cm |
| Notes | "A Wiley-Interscience publication." Bibliography: p. 365-377 Includes index |
| Subjects | LCSH:Medicine -- Research -- Statistical methods
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LCSH:Medical sciences -- Statistical methods -- Computer programs All Subject Search LCSH:Regression analysis -- Data processing All Subject Search LCSH:Prognosis -- Statistical methods All Subject Search LCSH:Logistic distribution |
| Classification | NDC9:490.7 LCC:R853.S7 DC21:610/.7/27 |
| Language | English |
| ID | 0000394656 |
| ISBN | 0471154105 |
| NCID |
BA40803649 
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