Applied logistic regression / David W. Hosmer, Stanley Lemeshow
(Wiley series in probability and mathematical statistics ; . Texts and references section)
(A Wiley-Interscience publication)
| Publisher | New York : Wiley |
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| Year | c2000 |
| Edition | 2nd ed |
| Authors | *Hosmer, David W. Lemeshow, Stanley |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Restriction | Reserve |
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| Library Main Building 3rd fl. (Foreign Books) |
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4100:688 | 120004184K |
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| Chiyoda (General Collection) |
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K4100:69 | 120403527O |
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| Material Type | Books |
|---|---|
| Size | xii, 375 p. : ill. ; 25 cm |
| Notes | Addendum: p. 352-353 Includes bibliographical references (p. 354-367) and index |
| Subjects | LCSH:Regression analysis |
| Classification | LCC:QA278.2 DC21:519.5/36 NDC9:417 NDC8:417 |
| Language | English |
| ID | 0000409230 |
| ISBN | 0471356328 |
| NCID |
BA48890873 
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