Thinning methodologies for pattern recognition / edited by C.Y. Suen, P.S.P. Wang
(Series in machine perception and artificial intelligence / editors, H. Bunke, P.S.P. Wang ; v. 8)
| Publisher | Singapore : World Scientific |
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| Year | c1994 |
| Authors | Suen, Ching Y. Wang, Patrick S.-P. |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Restriction | Reserve |
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| Library Main Building Basement (Kodaira Classification) |
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702:9 | 229500085V |
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| Material Type | Books |
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| Size | 344 p. : ill., ports. ; 26 cm |
| Notes | Includes bibliographical references |
| Subjects | LCSH:Image processing -- Digital techniques
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LCSH:Optical pattern recognition LCSH:Pattern recognition systems LCSH:Parallel processing (Electronic computers) LCSH:Algorithms |
| Classification | LCC:TA1637 DC20:006.4/2 |
| Language | English |
| ID | 0000317463 |
| ISBN | 9810214820 |
| NCID |
BA23011702 
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