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Possible reliability problems affecting use of TOEIC IP Test scores / Brian D. Bresnihan
(兵庫県立大学政策科学研究叢書 ; v. 83)

Publisher Kobe : Institute for Policy Analysis and Social Innovation, University of Hyogo
Year 2010
Authors Bresnihan, Brian D.

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Library Main Building 3rd fl. (Foreign Books)
3700:950 121003891P



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Material Type Books
Size 329 p. : ill. ; 21 cm
Notes "University of Hyogo Monograph Vol. LXXXII"--T.p. verso
Includes bibliographical references
Classification NDC8:802
NDLC:KE41
Language English
ID 1000702053
NCID BB0382858X WCLINK

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